TH-Raman Probe for low wavenumber region measurement
The Raman spectrum in the low-frequency region can be measured non-contactly and non-destructively.
The TH-RamanProbe system consists of a control unit made up of a laser light source and power supply, and a probe that irradiates the sample with laser light and receives Raman scattered light from the sample. A special notch filter that cuts the excitation laser is built into the probe section. The probe, equipped with a sapphire lens that has high throughput, is available in two types: short focus and long focus, depending on the measurement purpose.
